[1]
Pabón-Beltrán, A.C., Sanabria-Martínez, F., Vásquez-Quintero, C., Barba-Ortega, J.J. and Valbuena-Niño, E.D. 2021. Study of Concentration-depth Profiles of the Titanium and Nitrogen Ions by SRIM/TRIM Simulation. Ingenieria y Universidad. 25, (Oct. 2021). DOI:https://doi.org/10.11144/Javerina.iued25.scpt.