PABÓN-BELTRÁN, A. C.; SANABRIA-MARTÍNEZ, F.; VÁSQUEZ-QUINTERO, C.; BARBA-ORTEGA, J. J.; VALBUENA-NIÑO, E. D. Study of Concentration-depth Profiles of the Titanium and Nitrogen Ions by SRIM/TRIM Simulation. Ingenieria y Universidad, [S. l.], v. 25, 2021. DOI: 10.11144/Javerina.iued25.scpt. Disponível em: https://revistas.javeriana.edu.co/index.php/iyu/article/view/28403. Acesso em: 24 sep. 2022.