Pabón-Beltrán AC, Sanabria-Martínez F, Vásquez-Quintero C, Barba-Ortega JJ, Valbuena-Niño ED. Study of Concentration-depth Profiles of the Titanium and Nitrogen Ions by SRIM/TRIM Simulation. IyU [Internet]. 2021 Oct. 12 [cited 2024 Apr. 26];25. Available from: https://revistas.javeriana.edu.co/index.php/iyu/article/view/28403